Daejeon, South Korea

The-mahn Nguyen

This inventor holds 1 USPTO granted patent. Top assignee: Korea Research Institute of Standards and Science. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: The-mahn Nguyen. Retrieved from https://idiyas.com/inventor/the-mahn-nguyen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: The-mahn Nguyen: Innovator in Phase-Shifting Deflectometry

Introduction

The-mahn Nguyen is a notable inventor based in Daejeon, South Korea. He has made significant contributions to the field of phase-shifting deflectometry, particularly in developing systems and methods that enhance measurement accuracy.

Latest Patents

Nguyen holds a patent titled "System and method for compensating for non-linear response characteristic in phase-shifting deflectometry." This patent addresses the challenges of measuring the shape of objects by compensating for non-linear response characteristics. The method involves generating a pattern, projecting it onto a measurement object, and obtaining an image of the deformed pattern. It also includes linearizing non-linear responses using a look-up table and compensating for phase-shifting amounts caused by these non-linear characteristics.

Career Highlights

Nguyen is affiliated with the Korea Research Institute of Standards and Science, where he applies his expertise in measurement technologies. His work has been instrumental in advancing the accuracy and reliability of phase-shifting deflectometry techniques.

Collaborations

Nguyen has collaborated with esteemed colleagues such as Young-sik Ghim and Hyug-gyo Rhee. Their combined efforts contribute to the ongoing research and development in the field of measurement science.

Conclusion

The-mahn Nguyen's innovative work in phase-shifting deflectometry exemplifies the importance of addressing non-linear response characteristics in measurement systems. His contributions continue to influence advancements in this critical area of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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