This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignees: Riken Corporation, Topcon Corporation. Active years: 2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:


Years Active: 2024
Title: Tetsuya Yuasa: Innovator in Optical Measurement Technology
Introduction
Tetsuya Yuasa is a notable inventor based in Yamagata, Japan. He has made significant contributions to the field of optical measurement technology. His innovative work has led to the development of a unique optical interference measuring apparatus.
Latest Patents
Yuasa holds a patent for an "Optical interference measuring apparatus and optical interference measuring method." This invention includes a measuring unit that acquires an interferogram of an interference wave. The apparatus utilizes electromagnetic waves to irradiate a measuring target and a reference surface, causing reflected waves to interfere. The signal processing unit performs a Fourier transform of the interferogram to configure an intensity profile in the depth direction. It estimates parameters for a model formula based on the assumed surface count and selects an optimal model using statistical techniques.
Career Highlights
Throughout his career, Tetsuya Yuasa has worked with prominent companies such as Topcon Corporation and Riken Corporation. His experience in these organizations has allowed him to refine his skills and contribute to advancements in optical measurement technologies.
Collaborations
Yuasa has collaborated with notable colleagues, including Homare Momiyama and Yoshiaki Sasaki. Their combined expertise has furthered the development of innovative solutions in their field.
Conclusion
Tetsuya Yuasa's contributions to optical measurement technology exemplify the impact of innovation in scientific research. His patent and collaborations highlight his commitment to advancing this important area of study.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile