Matsudo, Japan

Tetsumasa Ito

This inventor holds 1 USPTO granted patent. Top assignees: Sii Nanotechnology Inc., Tum Gene, Inc.. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tetsumasa Ito. Retrieved from https://idiyas.com/inventor/tetsumasa-ito-1u3y555f

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Tetsumasa Ito: Innovator in Gene Detection Technology

Introduction

Tetsumasa Ito is a prominent inventor based in Matsudo, Japan. He is known for his significant contributions to the field of gene detection technology. His innovative work has led to the development of advanced systems that enhance the accuracy and efficiency of gene detection.

Latest Patents

Tetsumasa Ito holds a patent for a gene detection system, which includes a gene detection device and a gene detecting chip. This system is designed to detect a target gene through hybridization with a probe. The device features a probe-immobilizing support where the probe is fixed, along with heating and cooling means that are in contact with a different location from the probe's surface. This innovative approach allows for rapid and highly sensitive gene detection through hybridization.

Career Highlights

Throughout his career, Tetsumasa Ito has worked with notable companies in the biotechnology sector. He has been associated with Sii Nanotechnology Inc. and Tum Gene, Inc., where he has contributed to the advancement of gene detection technologies.

Collaborations

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Conclusion

Tetsumasa Ito's work in gene detection technology exemplifies the impact of innovation in the field of biotechnology. His patented systems are paving the way for more efficient and sensitive methods of gene detection, showcasing his role as a key inventor in this important area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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