Kanagawa, Japan

Teruo Manome

This inventor holds 1 USPTO granted patent. Top assignee: Sony/tektronix Corporation. Active years: 1986.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 1986

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1 patent (USPTO):Explore Patents

Title: Teruo Manome: Innovator in Probe Calibration Technology

Introduction

Teruo Manome is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of probe calibration technology. His innovative approach has led to the development of a unique method that enhances the accuracy of probe testing.

Latest Patents

Teruo Manome holds a patent for a "Method and apparatus for testing probe calibration." This patent describes a method where a square-wave signal is applied to a probe. The resulting cyclic probe output signal is then compared to a reference level at multiple points along one cycle of the output signal. The reference signal is adjusted iteratively until it is slightly less than or greater than the minimum or maximum peak magnitude of the probe output signal. The calibration of the probe is determined based on whether the output signal's magnitude at each point is greater than or less than the reference level.

Career Highlights

Manome has worked with prominent companies, including Sony and Tektronix Corporation. His work has been instrumental in advancing the technology used in electronic testing and calibration. His expertise in this area has made him a valuable asset to his team and the industry.

Collaborations

Throughout his career, Teruo Manome has collaborated with talented individuals such as Kentaro Takita and Minoru Fukuta. These collaborations have fostered innovation and have contributed to the success of various projects.

Conclusion

Teruo Manome's contributions to probe calibration technology exemplify his dedication to innovation. His patent and collaborative efforts highlight his role as a significant figure in the field. His work continues to influence advancements in electronic testing methodologies.

Profile summary based on public USPTO records.
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