The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 1986
Filed:
Nov. 01, 1982
Applicant:
Inventors:
Teruo Manome, Kanagawa, JP;
Yasuhiko Miki, Tokyo, JP;
Kentaro Takita, Tokyo, JP;
Minoru Fukuta, Tokyo, JP;
Assignee:
Sony/Tektronix Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G01R / ;
U.S. Cl.
CPC ...
364571 ; 324 / ; 364579 ;
Abstract
In a method for testing for probe calibration, a square-wave signal is applied to a probe and a cyclic probe output signal resulting therefrom is compared to a reference level at a plurality of points along one cycle of the output signal. The reference signal is iteratively increased or decreased until it is less than or greater than a minimum or maximum peak magnitude of the probe output signal by a small amount. The probe is then determined to be calibrated according whether the magnitude of the output signal at each point is greater than or less than the reference level.