Te-Kun Lin

Title: Te-Kun Lin: Innovator in Probe Card Technology

Introduction

Te-Kun Lin is a notable inventor based in Tainan, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the development of probe card systems. With a total of 3 patents to his name, Lin's work has advanced the efficiency and effectiveness of testing semiconductor devices.

Latest Patents

One of Lin's latest patents is a method for detecting the contact force of a probe card. This innovative method involves using a pressure film sensor that interacts with multiple needles on the lower surface of the probe card. The sensor detects the contact force, allowing for adjustments to be made to a push base on the upper surface of the probe card based on the detected force.

Another significant patent focuses on the manufacturing process of probe card needles. This method refines and processes a conductive body extending from the probe card to create a tip at the end. The process includes removing portions of the conductive body using an electrolytic fluid, enabling the formation of needles with various sizes, shapes, and profiles, such as cylindrical, rectangular, triangular, and trapezoidal.

Career Highlights

Te-Kun Lin is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work at this prestigious company has allowed him to collaborate with other talented professionals in the field.

Collaborations

Lin has worked alongside notable colleagues, including Ming-Cheng Hsu and Yu-Hsien Tsai, who contribute to the innovative environment at their workplace.

Conclusion

Te-Kun Lin's contributions to probe card technology exemplify his commitment to innovation in the semiconductor industry. His patents reflect a deep understanding of the technical challenges in this field and offer solutions that enhance testing processes.