Malacca, Malaysia

Tay Bok Her

This inventor holds 3 USPTO granted patents. Top assignees: Semiconductor Technologies & Instruments Pte. Ltd., Asti Holdings Limited. Active years: 2001-2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tay Bok Her. Retrieved from https://idiyas.com/inventor/tay-bok-her

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 66.7

Average Co-Inventor Count = 1.0

ph-index = 2

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2001-2003

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3 patents (USPTO):Explore Patents

Title: Innovations of Tay Bok Her

Introduction

Tay Bok Her is a notable inventor based in Melaka, Malaysia. He has made significant contributions to the field of technology, particularly in inspection systems. With a total of three patents to his name, his work reflects a commitment to innovation and quality.

Latest Patents

One of Tay Bok Her's latest patents is a post-seal inspection system and method. This system is designed for inspecting components that are sealed within tape. It includes a light source that illuminates the components through the tape layer. A polarizer is utilized to polarize light from the light source, the components, and the tape layer, effectively reducing glare and reflected light. An image system receives light from the polarizer and stores image data for each component, enhancing the inspection process.

Career Highlights

Throughout his career, Tay Bok Her has worked with reputable companies, including Semiconductor Technologies & Instruments Pte. Ltd. and Asti Holdings Limited. His experience in these organizations has contributed to his expertise in developing innovative solutions.

Collaborations

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Conclusion

Tay Bok Her's contributions to the field of technology through his patents and career experiences highlight his role as an influential inventor. His innovative approaches continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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