Tokyo, Japan

Taro Shimizu

This inventor holds 1 USPTO granted patent. Top assignee: Nec Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Taro Shimizu. Retrieved from https://idiyas.com/inventor/taro-shimizu-n4rtpywg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Taro Shimizu: Innovator in Information Processing Technology

Introduction

Taro Shimizu is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of information processing technology. His innovative work focuses on enhancing facility inspection processes through advanced information processing devices.

Latest Patents

Taro Shimizu holds a patent for an "Information processing device, information processing method, and non-transitory computer-readable storage medium." This invention aims to support facility inspection work by providing a device that extracts facility displacement information from ground surface displacement data. The device includes a calculation unit that determines inspection work priorities for multiple facilities based on this information. He has 1 patent to his name.

Career Highlights

Taro Shimizu is associated with NEC Corporation, a leading technology company in Japan. His work at NEC has allowed him to develop and refine his innovative ideas in information processing. His contributions have been instrumental in advancing the capabilities of technology in facility management.

Collaborations

Taro has collaborated with notable colleagues, including Daisuke Hashizume and Takakazu Ishii. Their teamwork has fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Taro Shimizu is a key figure in the realm of information processing, with a focus on improving facility inspection methodologies. His patent and work at NEC Corporation highlight his commitment to innovation and technological advancement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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