The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Oct. 18, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Daisuke Hashizume, Tokyo, JP;

Takakazu Ishii, Tokyo, JP;

Hiromichi Hirata, Tokyo, JP;

Shouhei Ohno, Tokyo, JP;

Hiroyuki Kumeno, Tokyo, JP;

Ko Makiyama, Tokyo, JP;

Taro Shimizu, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01); G06Q 50/10 (2012.01);
U.S. Cl.
CPC ...
G01S 13/90 (2013.01); G06Q 50/10 (2013.01);
Abstract

One purpose of this disclosure is to provide an information processing device, and the like, that make it possible to support facility inspection work. An information processing device according to one embodiment of this disclosure comprises an extraction unit for extracting, from displacement information indicating the displacement of the height of a ground surface, facility displacement information indicating the displacement of each of a plurality of facilities installed on the ground surface and a calculation unit for using the facility displacement information to calculate inspection work priorities for the plurality of facilities.


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