Company Filing History:
Years Active: 2016-2021
Title: Tapan Jyoti Chakraborty: Innovator in Integrated Circuit Testing
Introduction
Tapan Jyoti Chakraborty is a prominent inventor based in San Diego, CA (US). He has made significant contributions to the field of integrated circuit testing, holding a total of 4 patents. His work focuses on enhancing the efficiency and effectiveness of testing methodologies for integrated circuits.
Latest Patents
Chakraborty's latest patents include innovative solutions such as the "Zero-pin test solution for integrated circuits." This patent outlines a method for testing integrated circuits (ICs) by utilizing a test controller embedded within the IC. The method involves transitioning the IC from a normal mode to a test mode, allowing for the communication of test signals to data storage elements within the IC. Another notable patent is the "Efficient test architecture for multi-die chips," which provides a framework for external testers to conduct various tests on multi-die chips. This architecture enables both die-level and chip-level testing, ensuring thorough evaluation of interconnections and external connections.
Career Highlights
Chakraborty is currently employed at Qualcomm Incorporated, a leading company in the telecommunications and semiconductor industry. His role involves developing advanced testing solutions that contribute to the reliability and performance of integrated circuits.
Collaborations
Throughout his career, Chakraborty has collaborated with notable colleagues, including Roberto Averbuj and Alvin Leng Sun Loke. These collaborations have fostered innovation and have led to the development of cutting-edge testing technologies.
Conclusion
Tapan Jyoti Chakraborty is a distinguished inventor whose work in integrated circuit testing has paved the way for advancements in the field. His patents reflect a commitment to improving testing methodologies, ultimately enhancing the performance of electronic devices.