The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2021
Filed:
Oct. 01, 2019
Qualcomm Incorporated, San Diego, CA (US);
Tapan Jyoti Chakraborty, San Diego, CA (US);
Umesh Srikantiah, San Diego, CA (US);
Rachana Rout, San Diego, CA (US);
QUALCOMM INCORPORATED, San Diego, CA (US);
Abstract
In some aspects, the present disclosure provides a method for testing an integrated circuit (IC). In some configurations, the method includes determining, by a test controller embedded in the IC, a change in operation of the IC from a normal mode to a test mode. The method also includes communicating, by the test controller to a chain of data storage elements in the IC: a first test signal configured to change an input/output (I/O) function of a first IC pin, and a second test signal configured to apply one of a plurality of test functions to each data storage element in the chain of data storage elements. The method also includes, receiving, via a second IC pin, a test clock signal configured to control a latch function of each data storage element in the chain of data storage elements.