Chennai, India

Tanay Bansal

This inventor holds 1 USPTO granted patent. Top assignee: Kla Tencor Corporation. Active years: 2020.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 20(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Tanay Bansal: Innovator in Deep Learning and Image Quantification

Introduction

Tanay Bansal is a prominent inventor based in Chennai, India. He has made significant contributions to the field of deep learning and image processing. His innovative work focuses on defect detection and classification schemes that enhance image quantification.

Latest Patents

Tanay holds a patent titled "Using deep learning based defect detection and classification schemes for pixel level image quantification." This patent describes a method for representing a heat map of probable defects in an image as a matrix of defect probability indices corresponding to each pixel. The images can be generated from data received from detectors of scanning electron microscopes or other inspection tools. The method allows for the quantification of pixels in the image that exceed a corresponding threshold in the matrix.

Career Highlights

Tanay Bansal is currently employed at Kla Tencor Corporation, where he applies his expertise in deep learning and image analysis. His work at the company has positioned him as a key player in advancing technologies related to defect detection.

Collaborations

Tanay collaborates with talented individuals such as Sivaprrasath Meenakshisundaram and Hari Pathangi. Their combined efforts contribute to the innovative projects at Kla Tencor Corporation.

Conclusion

Tanay Bansal is a noteworthy inventor whose work in deep learning and image quantification is paving the way for advancements in defect detection technologies. His contributions are significant in the realm of image processing and continue to influence the industry.

Profile summary based on public USPTO records.
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