Singapore, Singapore

Tan Seow Hoon

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignees: Asti Corporation, Semiconductor Technologies & Instruments Pte. Ltd.. Active years: 2001-2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tan Seow Hoon. Retrieved from https://idiyas.com/inventor/tan-seow-hoon

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 3.7

ph-index = 2

Forward Citations = 56(Granted Patents)


Company Filing History:


Years Active: 2001-2002

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2 patents (USPTO):Explore Patents

Title: Tan Seow Hoon: Innovator in Machine Vision Technology

Introduction

Tan Seow Hoon is a notable inventor based in Singapore, recognized for his contributions to machine vision technology. He holds 2 patents that showcase his innovative approach to enhancing inspection systems.

Latest Patents

His latest patents include a system for 3D profile analysis for surface contour inspection. This system utilizes an imaging system, such as a digital camera, connected to a controller that processes digital image data to generate control commands. Additionally, he developed an adaptive lighting system and method for machine vision apparatus. This system features a variable intensity lighting setup that captures high contrast images of articles, such as semiconductor packages, using a programmable intensity control circuit.

Career Highlights

Throughout his career, Tan has worked with reputable companies, including Semiconductor Technologies & Instruments Pte. Ltd. and Asti Corporation. His work has significantly impacted the field of machine vision, particularly in improving inspection processes.

Collaborations

Tan has collaborated with professionals such as Noor Ashedah Binti Jusoh and Sreenivas Rao, contributing to advancements in technology and innovation.

Conclusion

Tan Seow Hoon's work in machine vision technology exemplifies his commitment to innovation and excellence. His patents reflect a deep understanding of the challenges in inspection systems and provide effective solutions for the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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