Tan-Ju Wang

Title: Innovations of Tan-Ju Wang in Virtual Metrology

Introduction

Tan-Ju Wang is an accomplished inventor based in Tainan, Taiwan. He has made significant contributions to the field of virtual metrology, particularly through his innovative use of convolutional neural networks (CNNs). His work is instrumental in enhancing the accuracy and efficiency of metrology processes in various applications.

Latest Patents

Tan-Ju Wang holds a patent for a "Virtual metrology method using convolutional neural network and computer program product thereof." This patent describes a method that employs a dynamic time warping (DTW) algorithm to eliminate dissimilar sets of process data. The method adjusts these sets to ensure they are of the same length, allowing the CNN to be effectively utilized for virtual metrology. The virtual metrology model includes multiple CNN models and a conjecture model, where the inputs are sets of time sequence data from various parameters, and the outputs serve as inputs to the conjecture model. He has 1 patent to his name.

Career Highlights

Tan-Ju Wang is affiliated with National Cheng Kung University, where he continues to advance research in metrology and machine learning. His academic and research endeavors have positioned him as a key figure in the development of innovative technologies in his field.

Collaborations

Tan-Ju Wang has collaborated with notable colleagues, including Fan-Tien Cheng and Yu-Ming Hsieh. Their joint efforts contribute to the advancement of research and innovation in virtual metrology.

Conclusion

Tan-Ju Wang's contributions to virtual metrology through his innovative patent demonstrate his expertise and commitment to advancing technology in this field. His work continues to influence the landscape of metrology and machine learning applications.