Tamaki Toumiya

Title: Tamaki Toumiya: Innovator in Test Pattern Generation

Introduction

Tamaki Toumiya is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of test pattern generation, holding a total of 3 patents. His work focuses on improving the efficiency and effectiveness of test pattern generation methods and systems.

Latest Patents

Toumiya's latest patents include a "Test pattern compression method, apparatus, system and storage medium." This invention outlines a system and method for test pattern compression that involves a local CPU dividing faults into multiple fault groups. These groups are assigned to respective remote CPUs, which generate test patterns with undefined values for pins of the logic circuit that do not participate in fault detection. The local CPU then acquires these test patterns, merges those with identical pattern numbers, and attempts to further merge the newly generated test patterns. Another significant patent is the "Method and system for test pattern generation and a computer-readable medium instructing the system to perform the method." This invention aims to reduce the processing time for test pattern generation by dividing the target circuit into several subcircuits and determining the pattern generation order for each subcircuit to minimize total generation time.

Career Highlights

Throughout his career, Tamaki Toumiya has worked with prominent companies such as NEC Corporation and NEC Electronics Corporation. His experience in these organizations has contributed to his expertise in the field of test pattern generation.

Collaborations

One of his notable coworkers is Toshinobu Ono, who has collaborated with him on various projects.

Conclusion

Tamaki Toumiya's innovative work in test pattern generation has led to significant advancements in the field. His patents reflect a commitment to improving efficiency and effectiveness in technology.