The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2004
Filed:
Sep. 28, 2000
Tamaki Toumiya, Tokyo, JP;
NEC Electronics Corporation, Kanagawa, JP;
Abstract
A system and method for test pattern compression includes a local CPU for dividing faults into a plurality of fault groups, assigning the fault groups to respective remote CPUs, that are connected to the local CPU in parallel with each other. Each remote CPU generates test patterns having undefined values assigned to pins of the logic circuit that do not participate in fault detection. The local CPU acquires pluralities of test patterns of the remote CPUs, generates new test patterns obtained by merging those test patterns that have identical pattern numbers among the pluralities of test patterns, and attempts to merge these newly generated test patterns.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile