Tal Frank

Title: Tal Frank - Innovator in Semiconductor Imaging

Introduction

Tal Frank is an inventor based in Tel Aviv, Israel. He is known for his contributions to the field of semiconductor imaging. Although he currently holds no granted patents, his innovative work is reflected in his latest patent applications.

Latest Patent Applications

Tal Frank's latest patent applications include:

1. **Registration Between an Inspection Image and a Design Image** - This application describes systems and methods for obtaining an inspection image of a semiconductor specimen and a design image. The design image provides information about design elements. The process involves determining data informative of a periodic distance between design elements associated with a shape meeting a similarity criterion. This data is then used to obtain registration data between the design image and the inspection image.

2. **Systems and Methods for Registration Between Images Informative of One or More Semiconductor Specimens** - This application outlines systems and methods for obtaining an inspection image of a semiconductor specimen and a second image. It involves applying a distance transform operation to parts of the second image or an image derived from it. A similar operation is performed on the inspection image to obtain a transformed inspection image. The matching operation uses data from both transform images to identify areas of the inspection image that match the second image according to a matching criterion.

Conclusion

Tal Frank is an innovative inventor whose work in semiconductor imaging showcases his commitment to advancing technology in this field. His latest patent applications reflect his ongoing efforts to develop systems that enhance the accuracy and efficiency of semiconductor inspections.