Tochigi, Japan

Takumi Kawamata

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Canon Kabushiki Kaisha. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takumi Kawamata. Retrieved from https://idiyas.com/inventor/takumi-kawamata

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Takumi Kawamata: Innovator in Position Calculation Technology

Introduction

Takumi Kawamata is a notable inventor based in Tochigi, Japan. He has made significant contributions to the field of inspection technology, particularly in methods for calculating the position or angle of inspection targets.

Latest Patents

Kawamata holds a patent for a "Method for calculating position or angle of inspection target, storage medium, apparatus, and system." This innovative method utilizes sine wave and cosine wave signals from an encoder or laser interferometer to accurately determine the position or angle of an inspection target. The process involves acquiring the temporary movement speed of the inspection target, calculating an amplitude correction value, and correcting the amplitudes of the signals to compute the offset error in a Lissajous waveform.

Career Highlights

Kawamata is associated with Canon Kabushiki Kaisha, a leading company in imaging and optical products. His work at Canon has allowed him to develop and refine technologies that enhance precision in inspection processes.

Collaborations

One of his notable coworkers is Satoshi Kubo, with whom he has likely collaborated on various projects within the company.

Conclusion

Takumi Kawamata's innovative work in position calculation technology exemplifies the advancements being made in inspection methods. His contributions continue to influence the field and enhance the capabilities of inspection systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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