Tokyo, Japan

Takeshi Okushi

This inventor holds 2 USPTO granted patents. Top assignee: Adv Antest Corporation. Active years: 2017-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takeshi Okushi. Retrieved from https://idiyas.com/inventor/takeshi-okushi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2017-2018

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2 patents (USPTO):Explore Patents

Title: The Innovations of Takeshi Okushi

Introduction

Takeshi Okushi is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of electronic device testing. With a total of 2 patents to his name, Okushi continues to push the boundaries of innovation in his industry.

Latest Patents

His latest patents include a "Socket for Electronic Device Testing Apparatus" and a "Socket for an Electronic Device Testing Apparatus." These inventions showcase his expertise and commitment to improving electronic testing methodologies.

Career Highlights

Takeshi Okushi is currently employed at Advantest Corporation, a leading company in the field of automated test equipment. His work at Advantest has allowed him to develop and refine his innovative ideas, contributing to the company's reputation for excellence.

Collaborations

Throughout his career, Okushi has collaborated with talented individuals such as Mitsunori Aizawa and Masanori Nagashima. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Takeshi Okushi's contributions to electronic device testing through his patents and collaborations highlight his role as a key innovator in the field. His work continues to inspire advancements in technology and testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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