Inventors with similar research interests:
Location History:
- Hachioji, JP (2003 - 2004)
- Chiba, JP (2007 - 2010)
- Kanagawa, JP (2010 - 2021)
- Tokyo, JP (2001 - 2024)
- Tainai, JP (2019 - 2024)
Company Filing History:
26 out of 139 
16 out of 495 
8 out of 58,131 
Years Active: 2001-2025
Areas of Expertise:
Title: **Innovative Contributions of Takeshi Kaneko in Charged Particle Beam Technology**
Introduction
Takeshi Kaneko, based in Tokyo, Japan, is an accomplished inventor with a remarkable portfolio of 64 patents. His innovative work primarily focuses on charged particle beam systems and contamination prevention methods for electron microscopy. Kaneko's advancements not only improve the efficiency of data acquisition but also enhance the reliability of specimen observations.
Latest Patents
Among his latest patents, the **Charged particle beam system and control method therefor** stands out as a significant advancement. This system is designed to prevent the data acquisition time from increasing, which is crucial for high-performance applications. The system incorporates elements such as a beam blanker, a tilt-controllable sample stage, and a blanking controller that regulates the duty ratio of a pulsed beam based on the tilt angle of the sample. This innovative approach allows for precise control over the charged particle beam, enhancing data collection efficiency.
Another noteworthy patent is the **Electron microscope and specimen contamination prevention method**, which addresses the common issue of contamination during specimen observation. This invention features a contamination prevention irradiation device comprising a generation unit for creating a laser beam and a mirror unit for reflecting this beam onto the specimen. By applying a pulse train laser beam before observation, Kaneko's method effectively prevents the deposition of contaminants, ensuring the integrity of the specimen for a designated period.
Career Highlights
Takeshi Kaneko has worked with notable companies in the field, including Tgk Co., Inc. and Hitachi Industrial Equipment Systems Co., Ltd. His experience in these organizations has contributed significantly to his development as an inventor and the evolution of his patented technologies.
Collaborations
Throughout his career, Kaneko has collaborated with esteemed professionals in the industry, including Ryosuke Satake and Hirotoshi Sato. These partnerships have further nurtured his inventive spirit and enhanced the quality of his contributions to the field of charged particle beam technology.
Conclusion
Takeshi Kaneko's innovations have made a substantial impact on the operational capabilities of charged particle beam systems and electron microscopy. His relentless pursuit of technological advancements continues to benefit the research and development sectors, establishing him as a key figure in the world of inventions and patents. As he progresses, the inventions he creates will undoubtedly pave the way for future innovations in his field.