Osaka, Japan

Takema Satoh

This inventor holds 2 USPTO granted patents. Top assignee: Osaka University. Active years: 2017-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takema Satoh. Retrieved from https://idiyas.com/inventor/takema-satoh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2017-2019

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Takema Satoh: Innovator in Light Wavelength Measurement

Introduction

Takema Satoh is a prominent inventor based in Osaka, Japan. He has made significant contributions to the field of light measurement technology. With a total of 2 patents, his work focuses on innovative methods for measuring light wavelengths.

Latest Patents

Takema Satoh's latest patents include a light wavelength measurement method and a light wavelength measurement apparatus. This method involves receiving target light on a second dispersion device that disperses the light into multiple beams. These beams reach various positions corresponding to the wavelength of the target light. The measurement of the wavelength is achieved by using these beams as a vernier scale within a specified wavelength range.

Career Highlights

Satoh is affiliated with Osaka University, where he continues to advance research in optical technologies. His work has garnered attention for its practical applications in various scientific fields.

Collaborations

Some of his notable coworkers include Tsuyoshi Konishi and Tomotaka Nagashima, who contribute to the collaborative research environment at Osaka University.

Conclusion

Takema Satoh's innovative approaches to light wavelength measurement exemplify the importance of research and development in optical technologies. His contributions continue to influence advancements in this critical area of science.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…