The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2017
Filed:
Mar. 10, 2014
Applicant:
Osaka University, Osaka, JP;
Inventors:
Assignee:
OSAKA UNIVERSITY, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/457 (2006.01); G01J 3/18 (2006.01); G01J 3/02 (2006.01); G02B 6/12 (2006.01);
U.S. Cl.
CPC ...
G01J 3/457 (2013.01); G01J 3/0297 (2013.01); G01J 3/18 (2013.01); G01J 3/2803 (2013.01); G02B 6/12 (2013.01); G01J 2003/1861 (2013.01); G01J 2003/2866 (2013.01);
Abstract
A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light (S, S); and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale (S, S).
Konishi, Tsuyoshi. (2017). Light wavelength measurement method and light wavelength measurement apparatus (U.S. Patent No. 9846081). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9846081
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile