This inventor holds 1 USPTO granted patent. Top assignee: Toshiba Memory Corporation. Active years: 2018.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2018
Title: Takehiro Nakai and His Patent for Detecting Crystal Defects.
Introduction
Takehiro Nakai is an inventor associated with Mie, Japan. His patent work includes a method for locating crystal defects in a substrate through chemical etching and microscopic examination.
Latest Patents
Nakai is credited with 1 patent: “Etching Method and Etchant.” The method uses an etchant containing hydrogen fluoride, nitric acid, hydrogen chloride, and water to form a concave portion at a site with a crystal defect. Examining that portion under a microscope helps locate the defect.
Career Highlights
Nakai is associated with Toshiba Memory Corporation. His patent describes an approach to identifying crystal defects in substrate materials.
Collaborations
Nakai’s listed coworkers include Sakae Funo and Youko Itabashi.
Conclusion
Takehiro Nakai’s patent presents a chemical etching and microscopy method for locating crystal defects, reflecting his work associated with Toshiba Memory Corporation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile