Sakai, Japan

Takayuki Mukai


Average Co-Inventor Count = 2.4

ph-index = 2

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2008-2010

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2 patents (USPTO):Explore Patents

Title: The Innovations of Takayuki Mukai

Introduction

Takayuki Mukai is a prominent inventor based in Sakai, Japan. He has made significant contributions to the field of three-dimensional measurement and photogrammetry. With a total of 2 patents to his name, Mukai's work has advanced the technology used in various measurement applications.

Latest Patents

Mukai's latest patents include a method and system for aligning three-dimensional shape data from photogrammetry data and three-dimensional measurement data using target locations and surface vectors. This innovative method involves performing photogrammetry on an object with a target mark to obtain its three-dimensional position and normal vector. The three-dimensional measurement of the object is then conducted to establish a correspondence between the two sets of data, allowing for accurate alignment of the three-dimensional shape data. Another notable patent is related to a three-dimensional shape measuring method and apparatus, which involves projecting slit light onto an object and acquiring two-dimensional images at varying focal lengths. This process enables the extraction of high contrast areas and the acquisition of distance information through triangulation.

Career Highlights

Mukai is currently employed at Konica Minolta Sensing, Inc., where he continues to develop innovative solutions in the field of measurement technology. His expertise and dedication to advancing three-dimensional measurement techniques have made him a valuable asset to his company.

Collaborations

Throughout his career, Mukai has collaborated with notable colleagues such as Yoshihisa Abe and Koji Harada. These partnerships have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Takayuki Mukai's contributions to the field of three-dimensional measurement and photogrammetry are noteworthy. His patents reflect a commitment to innovation and excellence in technology. Mukai's work continues to influence the industry and pave the way for future advancements.

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