Takasaki, Japan

Takayuki Kanzawa

This inventor holds 1 USPTO granted patent. Top assignee: Chino Corporation. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takayuki Kanzawa. Retrieved from https://idiyas.com/inventor/takayuki-kanzawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: Takayuki Kanzawa: Innovator in Measured Data Display Technology

Introduction

Takayuki Kanzawa is a notable inventor based in Takasaki, Japan. He has made significant contributions to the field of measured data display technology. His innovative approach has led to the development of a unique device that enhances the way measured data is visualized.

Latest Patents

Kanzawa holds a patent for a "Measured data display device with strip chart simulation and table format." This invention simulates a pen drawing measured data on a recording paper when displaying the data on a screen. The device utilizes a video memory to hold screen information similar to recording paper, while a data memory stores the measured data, providing a clear and effective visualization.

Career Highlights

Kanzawa is currently employed at Chino Corporation, where he continues to work on advancements in technology related to data display. His expertise and innovative mindset have positioned him as a valuable asset to the company.

Collaborations

Throughout his career, Kanzawa has collaborated with talented individuals such as Toshikazu Inden and Hideki Negishi. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Takayuki Kanzawa's contributions to measured data display technology exemplify the impact of innovation in enhancing data visualization. His work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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