This inventor holds 7 USPTO granted patents and 2 published patent applications and 1 EPO patent. Top assignee: Canon Kabushiki Kaisha. Active years: 2014-2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2014-2025
Title: Takashi Shiozawa: Innovator in Distance Measurement Technology
Introduction
Takashi Shiozawa is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of distance measurement technology, holding a total of seven patents. His innovative work has advanced the capabilities of various measurement devices, particularly in dynamic environments.
Latest Patents
Shiozawa's latest patents include a calibration method for a distance measurement device and a radiographic apparatus. The calibration method involves capturing images from different distances to calculate correction information for accurate distance measurement. This method allows for the effective use of a distance measurement device mounted inside a moving body, enhancing its functionality without the need for a transparent body. The radiographic apparatus he developed features a target array and an X-ray detecting unit, designed to improve the efficiency and accuracy of radiographic imaging.
Career Highlights
Throughout his career, Shiozawa has been associated with Canon Kabushiki Kaisha, a leading company in imaging and optical products. His work at Canon has allowed him to focus on developing cutting-edge technologies that address real-world challenges in measurement and imaging.
Collaborations
Shiozawa has collaborated with notable colleagues, including Kazuyuki Ueda and Kazuya Tsujino. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.
Conclusion
Takashi Shiozawa's contributions to distance measurement technology exemplify his dedication to innovation. His patents reflect a commitment to enhancing the accuracy and efficiency of measurement devices, making a lasting impact in his field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
