Tateyama, Japan

Takanori Kitaura

This inventor holds 1 USPTO granted patent. Top assignee: Nippon Steel Semiconductor Corporation. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takanori Kitaura. Retrieved from https://idiyas.com/inventor/takanori-kitaura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Takanori Kitaura: Innovator in Semiconductor Technology

Introduction

Takanori Kitaura is a prominent inventor based in Tateyama, Japan. He is known for his contributions to semiconductor technology, particularly in the development of innovative devices that enhance performance and manufacturing efficiency.

Latest Patents

Kitaura holds a patent for a semiconductor device and a method of manufacturing the same. This invention features an LOC (Lead On Chip) structure, which incorporates a protective film made from thermoplastic or thermosetting resin materials, such as polyimide or polyamide. The design allows for a simplified manufacturing process by bonding the semiconductor chip to the lead frame with the protective film interposed, thus reducing the number of processes involved.

Career Highlights

Kitaura is associated with Nippon Steel Semiconductor Corporation, where he has played a significant role in advancing semiconductor technologies. His work has contributed to the efficiency and reliability of semiconductor devices, making a notable impact in the industry.

Collaborations

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Conclusion

Takanori Kitaura's innovative work in semiconductor technology exemplifies the importance of advancements in this field. His patent reflects a significant step forward in manufacturing processes, showcasing his expertise and commitment to innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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