Kanagawa, Japan

Takamasa Chiba

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Graphtec Kabushiki Kaisha. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takamasa Chiba. Retrieved from https://idiyas.com/inventor/takamasa-chiba

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: The Innovations of Takamasa Chiba

Introduction

Takamasa Chiba is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of electronics, particularly in the development of testing systems for printed circuit boards. His innovative approach has led to advancements that enhance the reliability and efficiency of electronic devices.

Latest Patents

One of Takamasa Chiba's key patents is a printed circuit board function testing system. This system compares permissible range data to a waveform signal obtained from a given measuring point of a non-defective circuit board in actual operation. It also analyzes a waveform signal obtained from a corresponding given measuring point of a test circuit board in actual operation. This process allows for the accurate judgment of whether the test circuit board is defective or not. Chiba holds 1 patent for this invention.

Career Highlights

Takamasa Chiba is currently associated with Graphtec Corporation, where he continues to innovate and develop new technologies. His work has been instrumental in improving the quality control processes within the electronics industry. Chiba's expertise in circuit board testing has positioned him as a valuable asset in his field.

Conclusion

Takamasa Chiba's contributions to the electronics industry through his innovative testing systems have made a significant impact. His dedication to improving technology continues to inspire advancements in electronic device reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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