Yokohama, Japan

Graphtec Kabushiki Kaisha


USPTO Granted Patents = 19

% Expired Patents = 5.3


Forward Citations = 145

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42 inventors (with patents filed for the assignee):

goldMedal Kenji Yamamoto (2 out of 118 patents)

silverMedal Kouji Shimizu (2 out of 9 patents)

bronzeMedal Toshiyuki Takeuchi (2 out of 2 patents)

4.  Alfred S Krause (2 out of 2 patents)

5.  Isamu Aizawa (2 out of 2 patents)

6.  Yukihiro Kaneko (2 out of 2 patents)

7.  Masatoshi Noguchi (2 out of 2 patents)

8.  Daizou Yamazaki (2 out of 2 patents)

9.  Takeshi Toyosawa (2 out of 2 patents)

10.  Toshiya Watanabe (1 out of 18 patents)

11.  Masashi Nakamura (1 out of 81 patents)

12.  Kousuke Watanabe (1 out of 52 patents)

13.  Nobuyuki Kobayashi (1 out of 38 patents)

14.  Akira Yamamoto (1 out of 416 patents)

15.  Takamichi Yoshikawa (1 out of 2 patents)


19 patents:

Company Overview
Graphtec Kabushiki Kaisha, headquartered in Yokohama, Japan, specializes in the development and manufacturing of precision cutting plotters, scanners, and software solutions. The company is recognized for its innovative contributions to the fields of graphic arts, industrial design, and engineering, providing tools that enhance productivity and creativity. With a commitment to quality and technological advancement, Graphtec serves a diverse range of industries, including signage, packaging, and electronics, ensuring high-performance solutions tailored to customer needs.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

19 Patents

#54 in Yokohama

#3,039 in Japan

#32,663 in the World

Yokohama, JP
Yokohama, Japan
Forward Citations = 145

42 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Graphtec Kabushiki Kaisha. Retrieved from https://idiyas.com/company/graphtec-kabushiki-kaisha

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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