Kure, Japan

Takahumi Kano

This inventor holds 1 USPTO granted patent. Top assignee: Mitutoyo Corporation. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takahumi Kano. Retrieved from https://idiyas.com/inventor/takahumi-kano

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 58(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Takahumi Kano

Introduction

Takahumi Kano is a notable inventor based in Kure, Japan. He has made significant contributions to the field of measurement technology, particularly through his innovative patent. His work has implications for various industries that require precise measurement techniques.

Latest Patents

Kano holds a patent for a "Method of and an apparatus for measuring surface contour." This invention involves creating a measurement-datum similar to the profile of a measuring object. The apparatus allows for the relative movement between a detector and the measuring object, enabling the computation of the surface contour based on the measured data. This method eliminates the need for precise mechanical processing, making it easier to measure objects with unusual profiles that traditional apparatuses may struggle with.

Career Highlights

Kano is associated with Mitutoyo Corporation, a leading company in measurement technology. His work at Mitutoyo has allowed him to develop and refine his innovative ideas, contributing to the company's reputation for precision measurement solutions.

Collaborations

Kano has collaborated with notable colleagues, including Makoto Abe and Shigekata Ohta. Their teamwork has fostered an environment of innovation and creativity, leading to advancements in measurement technologies.

Conclusion

Takahumi Kano's contributions to measurement technology through his patent demonstrate his innovative spirit and dedication to precision. His work continues to influence the industry, showcasing the importance of advancements in measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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