Takahito Niwa

Title: The Innovations of Takahito Niwa

Introduction

Takahito Niwa is a notable inventor based in Kumamoto, Japan. He has made significant contributions to the field of imaging technology, particularly through his innovative patent related to imaging elements and apparatuses. His work has implications for enhancing the accuracy and efficiency of phase difference detection in imaging systems.

Latest Patents

Takahito Niwa holds a patent for an imaging element and imaging apparatus. This invention aims to reduce errors in phase difference detection by utilizing a phase difference pixel with a common on-chip lens for a pair of pixels. The imaging element comprises a pixel, an individual on-chip lens, a plurality of phase difference pixels, a common on-chip lens, and a pixel circuit. The individual on-chip lens collects incident light for each pixel, while the phase difference pixels are arranged adjacent to each other to detect phase differences. The common on-chip lens collects incident light for multiple phase difference pixels, and the pixel circuit generates an image signal based on transferred charge.

Career Highlights

Throughout his career, Takahito Niwa has worked with prominent companies in the technology sector. He has been associated with Sony Semiconductor Solutions Corporation and Sony Group Corporation, where he has contributed to various projects and innovations in imaging technology.

Collaborations

Takahito Niwa has collaborated with talented individuals in his field, including Yusuke Murakawa and Hideaki Togashi. These collaborations have likely enriched his work and led to advancements in imaging technology.

Conclusion

Takahito Niwa's contributions to imaging technology through his innovative patent demonstrate his expertise and commitment to advancing the field. His work continues to influence the development of more efficient imaging systems.