Niwa-gun, Japan

Takahiro Tamakoshi

This inventor holds 1 USPTO granted patent. Top assignee: Okuma Corporation. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takahiro Tamakoshi. Retrieved from https://idiyas.com/inventor/takahiro-tamakoshi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Takahiro Tamakoshi: Innovator in State Diagnostic Technology

Introduction

Takahiro Tamakoshi is a notable inventor based in Niwa-gun, Japan. He has made significant contributions to the field of diagnostic technology, particularly through his innovative patent. His work focuses on enhancing the accuracy and reliability of diagnostic models used in various applications.

Latest Patents

Takahiro Tamakoshi holds a patent for a state diagnostic device. This device is designed to collect usage state and diagnostic data of components. It selects diagnostic data from both normal and abnormal states, defining this selected data as master data. The device compares diagnosis results obtained from current and new diagnostic models to determine consistency. If the models are consistent, the diagnostic model is updated accordingly.

Career Highlights

Takahiro is associated with Okuma Corporation, where he applies his expertise in developing advanced diagnostic solutions. His work has been instrumental in improving the efficiency of diagnostic processes within the company.

Collaborations

Takahiro collaborates with talented colleagues, including Hiroshi Ueno and Tomoharu Ando. Their combined efforts contribute to the innovative environment at Okuma Corporation.

Conclusion

Takahiro Tamakoshi's contributions to state diagnostic technology exemplify the impact of innovation in enhancing diagnostic accuracy. His work continues to influence the field and drive advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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