The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Feb. 21, 2018
Applicant:

Okuma Corporation, Niwa-Gun, JP;

Inventors:

Takahiro Tamakoshi, Niwa-Gun, JP;

Hiroshi Ueno, Niwa-Gun, JP;

Tomoharu Ando, Niwa-Gun, JP;

Assignee:

Okuma Corporation, Niwa-Gun, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G01M 13/00 (2019.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0275 (2013.01); G01M 13/00 (2013.01); G05B 23/024 (2013.01); G05B 23/0297 (2013.01); G05B 19/4184 (2013.01);
Abstract

A state diagnostic device collects a usage state and diagnostic data of components, and selects, from the collected diagnostic data, at least one of diagnostic data obtained in a state where the usage state of the components is a truly normal state and diagnostic data obtained in a state where the usage state of the components is a truly abnormal state. The selected diagnostic data is defined as master data. A diagnosis result obtained by diagnosing the master data based on a current diagnostic model is compared with a diagnosis result obtained by diagnosing the master data based on a new diagnostic model, and whether the current diagnostic model is consistent with the new diagnostic model is determined. When the consistency is satisfied, the diagnostic model is updated from the current diagnostic model to the new diagnostic model.


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