Tak K Young

Title: Innovations by Tak K Young in Semiconductor Reliability

Introduction

Tak K Young is a notable inventor based in Cupertino, CA, who has made significant contributions to the field of semiconductor reliability. With a total of 3 patents, his work focuses on enhancing the reliability and efficiency of integrated circuit designs.

Latest Patents

One of his latest patents is titled "Method and system for reliability analysis of CMOS VLSI circuits based on stage partitioning and node activities." This innovative method provides a unique and efficient approach for reliability simulation of semiconductor chip designs that comprise millions of transistors. The process begins by storing device information about a chip design. It then partitions the complex circuit into smaller stages, estimating current consumption and contributions from each transistor. This allows for accurate determination of individual currents for reliability simulation. The method ultimately identifies potential design problems, enabling circuit designers to address issues like voltage drop and electro-migration before fabrication.

Another significant patent is the "Method and system of performing voltage drop analysis for power supply." This method tests for voltage drop violations in an integrated circuit through computer simulation. The IC chip area is divided into discrete regions, and the simulation time is segmented. By calculating average aggregate currents for each region, the power supply network is simulated only during peak activity, making the process more efficient. This targeted approach helps identify violation conditions without unnecessary simulations during low activity periods.

Career Highlights

Tak K Young is currently employed at Synopsys, Inc., a leading company in electronic design automation. His work at Synopsys has allowed him to apply his innovative methods to real-world semiconductor challenges, contributing to advancements in the industry.

Collaborations

Throughout his career, Tak has collaborated with notable colleagues such as Han Young Koh and Jeh-Fu Tuan. These collaborations have further enriched his work and contributed to the development of cutting-edge technologies in semiconductor reliability.

Conclusion

Tak K Young's contributions to semiconductor reliability through his innovative patents demonstrate his expertise and commitment to advancing technology in this critical field. His work not only enhances the efficiency of integrated circuits but also ensures their reliability in practical applications.