Utsunomiya, Japan

Taisuke Wakasa

This inventor holds 1 USPTO granted patent. Top assignee: Mitutoyo Corporation. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Taisuke Wakasa. Retrieved from https://idiyas.com/inventor/taisuke-wakasa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Taisuke Wakasa: Innovator in Encoder Technology

Introduction

Taisuke Wakasa is a notable inventor based in Utsunomiya, Japan. He has made significant contributions to the field of encoder technology, particularly through his innovative patent.

Latest Patents

Wakasa holds a patent for an "Encoder scale and manufacturing and attaching method thereof." This invention features an encoder scale that is displaced relative to a detector head. It includes an insulating substrate, a conductive adhesive layer formed on the substrate, and conductive pattern layers that enable the detector head to detect a position. The adhesive layer electrically connects all the pattern layers and includes an out-of-detection-range pattern that extends outward from the position detection range of the detector head. This out-of-detection-range pattern is grounded via a conductive member. He has 1 patent to his name.

Career Highlights

Wakasa is associated with Mitutoyo Corporation, a leading company in precision measurement instruments. His work has contributed to advancements in measurement technology, enhancing the capabilities of various devices.

Collaborations

Wakasa has collaborated with notable coworkers, including Takanori Otsuka and Kazuhiko Kodama. Their combined expertise has fostered innovation within their projects.

Conclusion

Taisuke Wakasa's contributions to encoder technology exemplify the spirit of innovation. His patent and work at Mitutoyo Corporation highlight his role as a key figure in advancing measurement technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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