Fujisawa, Japan

Taiji Kitagawa

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Taiji Kitagawa. Retrieved from https://idiyas.com/inventor/taiji-kitagawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Taiji Kitagawa: Innovator in Electron Microscopy

Introduction

Taiji Kitagawa is a prominent inventor based in Fujisawa, Japan. He has made significant contributions to the field of electron microscopy, particularly in the evaluation of resolving power in scanning electron microscopes. His innovative approach minimizes performance discrepancies among individual microscopes, enhancing their reliability and accuracy.

Latest Patents

Taiji Kitagawa holds a patent for a "Resolving power evaluation method and specimen for electron microscope." This invention provides a method for evaluating the performance of scanning electron microscopes without relying on visual sensory analysis. The method aims to reduce the differences in deterioration and performance that can occur with age among various microscopes. The specimen is created by overlaying materials with different emission coefficients of secondary charged particles. This includes secondary electrons, backscattered electrons, and transmitted electrons. A cross-section of the specimen is mirror-finished, and data from a scanning electron microscopical image is obtained. The resolving power performance is then quantitatively evaluated through frequency analysis.

Career Highlights

Taiji Kitagawa is associated with Hitachi, Ltd., a leading company in technology and innovation. His work has significantly impacted the field of electron microscopy, providing researchers and scientists with improved tools for their studies. His dedication to advancing technology is evident in his patent and the methodologies he has developed.

Collaborations

Taiji Kitagawa has collaborated with notable colleagues, including Mitsugu Sato and Goroku Shimoma. These partnerships have fostered an environment of innovation and have contributed to the advancements in electron microscopy.

Conclusion

Taiji Kitagawa's contributions to the field of electron microscopy exemplify the spirit of innovation. His patented methods enhance the performance evaluation of scanning electron microscopes, making significant strides in the accuracy and reliability of scientific research. His work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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