Alhambra, CA, United States of America

Tai-Ming Lin

This inventor holds 1 USPTO granted patent. Top assignee: Alpha and Omega Semiconductor International LP. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tai-Ming Lin. Retrieved from https://idiyas.com/inventor/tai-ming-lin-7zglfdul

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Tai-Ming Lin: Semiconductor Wafer Alignment Inventor.

Introduction

Tai-Ming Lin is an inventor based in Alhambra, California, whose patent work concerns semiconductor wafer fabrication. His listed patent is assigned to Alpha and Omega Semiconductor International LP.

Latest Patents

Lin is credited with 1 patent: “Method for Aligning Backside Pattern Based on One or More Frontside Alignment Marks of a Semiconductor Wafer.” The method describes forming alignment marks and super-junction buffer regions, adding epitaxial layers and a top layer, thinning the wafer, creating regions, and applying a singulation process. The patent describes devices designed to reduce misalignment between the top and bottom portions of an interface to less than 0.5 micron.

Career Highlights

Lin’s listed invention addresses alignment during semiconductor wafer processing, with the goal of improving precision between features formed on opposite sides of a wafer. His patent is associated with Alpha and Omega Semiconductor International LP.

Collaborations

The provided information lists Jian Wang and Lei Zhang as Lin’s coworkers.

Conclusion

Tai-Ming Lin’s patent focuses on reducing alignment errors in semiconductor devices through a wafer fabrication method, reflecting his contribution to precision manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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