This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignees: Samsung Display Co., Ltd., Samsung Display Co., Ltd.. Active years: 2025-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025-2026
Title: Taejun Kim - Innovator in Substrate Inspection Technology
Introduction
Taejun Kim is a notable inventor based in Yongin-si, South Korea. He has made significant contributions to the field of substrate inspection technology. His innovative work has led to the development of a unique apparatus that enhances the quality and efficiency of substrate inspections.
Latest Patents
Taejun Kim holds a patent for a "Substrate inspecting apparatus for obtaining synthetic image data and method of inspecting substrate by obtaining synthetic image data." This patent describes an advanced substrate inspection apparatus that includes an image sensor capable of obtaining first image data from a first substrate and second image data from a second substrate. The processor in the apparatus synthesizes these images to provide comprehensive inspection data, which is crucial for quality control in manufacturing processes.
Career Highlights
Taejun Kim is currently employed at Samsung Display Co., Ltd., where he continues to innovate and develop new technologies. His work at Samsung Display has positioned him as a key player in the advancement of display technologies, particularly in the area of substrate inspection.
Collaborations
Taejun has collaborated with several talented individuals, including Myoungchul Kim and Eonpil Shin. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.
Conclusion
Taejun Kim's contributions to substrate inspection technology exemplify the impact of innovation in the manufacturing sector. His patent and ongoing work at Samsung Display Co., Ltd. highlight his commitment to advancing technology and improving quality control processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
