The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Oct. 03, 2024
Samsung Display Co., Ltd., Yongin-si, KR;
Myoungchul Kim, Yongin-si, KR;
Taejun Kim, Yongin-si, KR;
Tae-Gu Kang, Yongin-si, KR;
Gunyoung Park, Yongin-si, KR;
Jihoon Seo, Yongin-si, KR;
Moonsung Choi, Yongin-si, KR;
SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do, KR;
Abstract
An inspection apparatus includes: a stage on which a display substrate having a plurality of cell regions and a boundary region adjacent to the plurality of cell regions is seated and a plurality of photographing units which photograph the display substrate. The plurality of photographing units may include a first photographing unit which photographs a first photographing region of the display substrate and a second photographing unit which photographs a second photographing region adjacent to the first photographing region of the display substrate, the first photographing unit is capable of independently adjusting the first photographing region and the second photographing units is capable of independently adjusting the second photographing region, and a boundary of the first photographing region and a boundary of the second photographing region overlap the boundary region in a plan view.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile