Suwon, South Korea

Taejoong Kim

This inventor holds 1 USPTO granted patent and 9 published patent applications. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Taejoong Kim. Retrieved from https://idiyas.com/inventor/taejoong-kim-4ddv3tkz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations of Taejoong Kim in Pupil Image Measurement

Introduction

Taejoong Kim is a notable inventor based in Suwon, South Korea. He has made significant contributions to the field of optical measurement technology. His work focuses on developing innovative devices that enhance the accuracy and efficiency of pupil image measurement.

Latest Patents

Taejoong Kim holds a patent for a "Pupil image measuring device and method." This device includes a light source that generates and outputs light, a stage for loading the measurement target, and an optical system that transmits the light to the target. Additionally, it features a detector that detects light reflected from the measurement target and a spatial light distribution controller that adjusts the intensity or amount of light output. This innovative device is designed to improve the precision of pupil measurements.

Career Highlights

Taejoong Kim is currently employed at Samsung Electronics Ltd., where he continues to work on cutting-edge technologies. His role at such a prestigious company highlights his expertise and commitment to advancing optical measurement solutions.

Collaborations

Taejoong Kim collaborates with talented coworkers, including Seungwoo Lee and Jinwoo Ahn. Their combined efforts contribute to the development of innovative technologies in the field.

Conclusion

Taejoong Kim's contributions to the field of pupil image measurement demonstrate his innovative spirit and dedication to advancing technology. His patent reflects a significant step forward in optical measurement devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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