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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12578178 B1

PDFFull Text
Date of Patent:
Mar. 17, 2026

Filed:

Aug. 10, 2023

Pupil image measuring device and method

Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Seungwoo Lee, Suwon-si, KR;

Jinwoo Ahn, Suwon-si, KR;

Taejoong Kim, Suwon-si, KR;

Myungjun Lee, Suwon-si, KR;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;

Attorney:

Sughrue Mion, PLLC

Primary Examiner:

Michael A Lyons

Int. Cl.
CPC ...
G01B 9/02 (2022.01); G01B 9/02015 (2022.01); G01N 21/88 (2006.01); G01N 21/95 (2006.01); G01N 21/956 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02043 (2013.01); G01B 9/02032 (2013.01); G01N 21/8806 (2013.01); G01N 21/9501 (2013.01); G01N 21/956 (2013.01); G01N 2201/0675 (2013.01); H01L 22/12 (2013.01);
Abstract

Provided is a pupil image measuring device including a light source configured to generate and output a light, a stage on which a measurement target is loaded, an optical system configured to transmit the light output from the light source, to the measurement target, a detector configured to detect a light reflected from the measurement target, and a spatial light distribution controller configured to adjust an intensity or amount of the light output from the light source or the reflected light, for each space of a plurality of spaces of the spatial light distribution controller, wherein the spatial light distribution controller is disposed on a pupil plane.

Find Patent Forward Citations

Lee, Seungwoo. (2026). Pupil image measuring device and method (U.S. Patent No. 12578178). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12578178

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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