Saratoga, CA, United States of America

Tae-Hee Lee

This inventor holds 2 USPTO granted patents. Top assignees: Sandisk 3D LLC, Sandisk Corporation. Active years: 2008-2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tae-Hee Lee. Retrieved from https://idiyas.com/inventor/tae-hee-lee-0xt77cje

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2008-2010

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2 patents (USPTO):Explore Patents

Title: Tae-Hee Lee: Innovator in Memory Card Technology

Introduction

Tae-Hee Lee is a notable inventor based in Saratoga, CA (US). He has made significant contributions to the field of memory card technology, holding 2 patents that enhance the functionality and reliability of memory cards.

Latest Patents

His latest patents include innovative methods of making and using memory cards with enhanced testability. By decreasing the amount of card substrate required to support the actual memory unit, the test interface of the card can remain on the card permanently. This design allows for easier testing and diagnosis in the event of a field failure, as the test interface remains accessible.

Career Highlights

Tae-Hee Lee has worked with prominent companies in the technology sector, including SanDisk 3D LLC and SanDisk Corporation. His experience in these organizations has contributed to his expertise in memory card technology and innovation.

Collaborations

One of his notable coworkers is Khushrav S Chhor, who has collaborated with him on various projects.

Conclusion

Tae-Hee Lee's contributions to memory card technology demonstrate his innovative spirit and commitment to improving electronic devices. His patents reflect a deep understanding of the challenges in the industry and offer practical solutions for enhanced performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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