Suwon, South Korea

Tae-Ha Jun

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tae-Ha Jun. Retrieved from https://idiyas.com/inventor/tae-ha-jun-9e37di0r

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Tae-Ha Jun and Semiconductor Equipment Process Control.

Introduction

Tae-Ha Jun is an inventor associated with Suwon, South Korea, and Samsung Electronics Co., Ltd. His patent work addresses process reliability and safeguards for semiconductor fabrication equipment.

Latest Patents

The provided information lists one patent for Jun: Process Error Prevention Method in Semiconductor Fabricating Equipment. The method limits how often equipment operators can reset interlocks after repeated occurrences within a specified period. Once the permitted number of resets is exceeded, the equipment is disabled and can be re-enabled only with an authorization code available to selected personnel. This approach is intended to ensure that necessary repairs and corrections are made before equipment returns to operation. Jun is credited with 1 patent.

Career Highlights

Jun’s listed invention focuses on preventing recurring process errors by combining interlock controls, reset limits, and restricted authorization. The patent is associated with Samsung Electronics Co., Ltd.

Collaborations

The provided information identifies Kyung-Bo Sim and Jong-Hwan Weon as Jun’s coworkers. Their specific roles in the patent or related work are not stated.

Conclusion

Tae-Ha Jun’s listed patent presents a controlled approach to semiconductor equipment safety, using restricted interlock resets and authorized reactivation to help ensure that recurring faults are addressed.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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