Nagano, Japan

Tadashi Iijima

This inventor holds 1 USPTO granted patent. Top assignee: Hioki E.e. Corporation. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tadashi Iijima. Retrieved from https://idiyas.com/inventor/tadashi-iijima-aeou0krf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2024

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovations of Tadashi Iijima

Introduction

Tadashi Iijima is a notable inventor based in Nagano, Japan. He has made significant contributions to the field of testing instruments, particularly in the analysis of winding characteristics. His work has streamlined the testing process, making it more efficient and effective.

Latest Patents

Iijima holds a patent for a testing instrument and test method that allows for easier and quicker analysis of winding characteristics. The invention includes an impulse voltage application capacitor, a switch, a current limiting resistor, and a parameter calculator. This innovative design enables the calculation of equivalent capacitor, inductor, and resistor values through regression analysis, significantly enhancing the testing process.

Career Highlights

Tadashi Iijima is associated with Hioki E.E. Corporation, a company known for its advanced electrical measurement instruments. His role at the company has allowed him to apply his expertise in developing innovative testing solutions that benefit various industries.

Collaborations

(Section skipped due to space constraints.)

Conclusion

Tadashi Iijima's contributions to the field of testing instruments exemplify the impact of innovation on technology. His patent reflects a commitment to improving efficiency in electrical testing, showcasing the importance of inventors in advancing industry standards.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…