Aichi, Japan

Tadashi Aoyama

This inventor holds 1 USPTO granted patent. Top assignee: Nidek Co., Ltd.. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tadashi Aoyama. Retrieved from https://idiyas.com/inventor/tadashi-aoyama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: The Innovations of Tadashi Aoyama

Introduction

Tadashi Aoyama is a notable inventor based in Aichi, Japan. He has made significant contributions to the field of inspection technology, particularly in the area of resist removal processes. His work is characterized by a focus on precision and efficiency, which is essential in modern manufacturing.

Latest Patents

One of Aoyama's key patents is an "Inspection apparatus for inspecting resist removal width." This innovative device includes an illumination unit that illuminates the outer surrounding portion of a substrate. It also features a detector that captures light reflected from this area. The judgment unit then assesses the light intensity of the detected reflected light to determine whether the resist removal width is appropriate. This patent showcases Aoyama's commitment to enhancing inspection processes in manufacturing.

Career Highlights

Tadashi Aoyama is currently employed at Nidek Co., Ltd., a company known for its advancements in optical and medical technologies. His role at Nidek has allowed him to apply his inventive skills in a practical setting, contributing to the company's reputation for innovation.

Collaborations

Aoyama has worked alongside Eiji Yonezawa, a fellow innovator. Their collaboration has likely fostered a creative environment that encourages the development of new technologies and solutions.

Conclusion

Tadashi Aoyama's contributions to the field of inspection technology exemplify the importance of innovation in manufacturing processes. His patent on the inspection apparatus highlights his dedication to improving efficiency and precision in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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