Hachioji, Japan

Tadao Suganuma

This inventor holds 1 USPTO granted patent. Top assignee: Elionix Inc.. Active years: 1985.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tadao Suganuma. Retrieved from https://idiyas.com/inventor/tadao-suganuma

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1985

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1 patent (USPTO):Explore Patents

Title: Tadao Suganuma: Innovator in Charged Particle Beam Technology

Introduction

Tadao Suganuma is a notable inventor based in Hachiouji, Japan. He has made significant contributions to the field of charged particle beam technology. His innovative approach has led to advancements that enhance the precision and efficiency of handling charged particle beams.

Latest Patents

Tadao Suganuma holds a patent for a "Method and apparatus for handling charged particle beam." This invention involves a method and apparatus that computes signals representative of astigmatism and corrections for it. The system detects values under specific conditions from signal particles derived from an object that is moved in at least two directions with respect to a charged particle beam. The computed amount and direction of astigmatism are displayed for manual correction, and the system can also perform astigmatism correction and focusing automatically. He has 1 patent to his name.

Career Highlights

Suganuma is associated with Elionix Inc., a company known for its expertise in electron beam lithography and related technologies. His work at Elionix has allowed him to apply his innovative ideas in a practical setting, contributing to the company's advancements in the field.

Conclusion

Tadao Suganuma's contributions to charged particle beam technology exemplify the impact of innovation in scientific fields. His patent reflects a commitment to improving precision in handling charged particle beams, showcasing his role as a significant inventor in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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