Ta-Yung Lee

Title: Ta-Yung Lee: Innovator in Test Probe Technology and Overhead Crane Design

Introduction

Ta-Yung Lee is a prominent inventor based in Taipei, Taiwan, with a remarkable portfolio consisting of four patented innovations. His contributions span critical technologies, including methods for test probe alignment control and the design of overhead cranes, showcasing his diverse engineering expertise.

Latest Patents

Among his latest patents, Lee introduced a groundbreaking system and method for aligning test probes with wafer contacts. This innovative method focuses on calculating a probe card's orientation relative to the wafer, utilizing historical offset corrections to ensure precise alignment and connectivity for efficient electrical testing. Additionally, Lee's patent for an overhead crane design incorporates advanced structural features and may include a vacuum system, demonstrating his commitment to enhancing machinery functionality.

Career Highlights

Throughout his career, Ta-Yung Lee has worked with esteemed companies, including Taiwan Semiconductor Manufacturing Company Ltd. and Integrated Telecom Express, Inc. His experience in these organizations has played a vital role in shaping his innovative approaches and technical knowledge in the field of engineering.

Collaborations

Lee has collaborated with notable professionals such as Jui-Long Chen and Chien-Chih Liao, contributing to his successful patent developments. These collaborations highlight the importance of teamwork and shared expertise in fostering innovation in technology.

Conclusion

Ta-Yung Lee's contributions to the fields of test probe technology and overhead crane design underscore his status as a significant inventor in Taiwan's technology landscape. His innovative patents not only facilitate advancements in engineering but also create a lasting impact on the industries he serves.