This inventor holds 1 USPTO granted patent. Top assignee: Aradigm Corporation. Active years: 2003.
Company Filing History:
Years Active: 2003
Title: Sze-The Young: Innovator in Non-Destructive Analysis
Introduction
Sze-The Young is a notable inventor based in San Jose, CA. He has made significant contributions to the field of non-destructive analysis, particularly in the inspection of materials. His innovative approach has led to the development of a unique method for analyzing perforations in various materials.
Latest Patents
Sze-The Young holds a patent for a "Method and device for non-destructive analysis of perforation in a material." This patent describes a method for inspecting small holes in a material by directing a light source through the holes and focusing the light onto a CCD detector. The techniques employed in this method allow for a reduction in the size of the image that needs to be inspected, thereby increasing sample throughput while still enabling detailed inspection of the hole number and quality. Additionally, the patent includes methods for producing an aerosolization container and device that can pass such inspections.
Career Highlights
Sze-The Young is currently associated with Aradigm Corporation, where he applies his expertise in non-destructive testing and analysis. His work has been instrumental in advancing the capabilities of material inspection technologies.
Collaborations
He has collaborated with notable colleagues, including Russell M Pon and Jeffrey A Schuster, contributing to various projects and innovations within the field.
Conclusion
Sze-The Young's contributions to non-destructive analysis have paved the way for advancements in material inspection techniques. His innovative methods continue to influence the industry and enhance the quality of inspections performed on various materials.