The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2003

Filed:

Jun. 10, 1999
Applicant:
Inventors:

Russell M. Pon, Danville, CA (US);

Rajesh S. Patel, Fremont, CA (US);

James M. Bovatsek, San Jose, CA (US);

Jeffrey A. Schuster, Berkeley, CA (US);

Geoffrey K. McKinley, Palo Alto, CA (US);

Sze-The Young, San Jose, CA (US);

Assignee:

Aradigm Corporation, Hayward, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

A method for inspecting small holes in a material is disclosed. The method comprises directing a light source through the holes in the material, and then focusing the light passing through the material onto a CCD detector. The focusing techniques allow for a reduction in the size of the image which must be inspected, thereby increasing sample throughput, while still allowing for detailed inspection of the hole number and quality. Methods of producing an aerosolization container and device comprising membranes which pass such an inspection are also provided.


Find Patent Forward Citations

Loading…