Tokyo, Japan

Syunji Tochihara

This inventor holds 1 USPTO granted patent. Top assignee: Kokusai Electric Co., Ltd.. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Syunji Tochihara. Retrieved from https://idiyas.com/inventor/syunji-tochihara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Syunji Tochihara: Innovator in Error Detection Technology

Introduction

Syunji Tochihara is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of error detection technology. His innovative work has led to the development of a patent that addresses critical issues in error correcting block codes.

Latest Patents

Tochihara holds a patent for an "Error Detector for Error Detecting Codes." This invention provides an effective method for detecting errors in received word vectors. The patent outlines a system that utilizes received syndrome vectors to identify acceptable error patterns, ensuring reliable data transmission.

Career Highlights

Tochihara is associated with Kokusai Electric Co., Ltd., where he has been instrumental in advancing error detection technologies. His expertise in this area has positioned him as a key figure in the development of reliable communication systems.

Collaborations

Throughout his career, Tochihara has collaborated with esteemed colleagues, including Kenzo Urabe and Giho Makino. These partnerships have fostered innovation and contributed to the success of their projects.

Conclusion

Syunji Tochihara's contributions to error detection technology exemplify the importance of innovation in ensuring data integrity. His work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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